Research Results from Korea University Update Understanding of Electronics (The Diagnosis of Shunt Defects in CIGS Modules Using Lock-In Thermography: An Empirical Comparative Study)

Press/Media: Press / Media

Period2023 Nov 9

Media coverage

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Media coverage

  • TitleResearch Results from Korea University Update Understanding of Electronics (The Diagnosis of Shunt Defects in CIGS Modules Using Lock-In Thermography: An Empirical Comparative Study)
    Media name/outletElectronics Daily
    Country/TerritoryUnited States
    Date23/11/9
    PersonsYoon Mook Kang, Yoonmook Kang, Haeseok Lee, Donghwan Kim
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