U.S. Patent and Trademark Office Awards Patent for Method for Measuring Interference in a Memory Device

Press/Media: Press / Media

Period	2022 Aug 3

Media coverage

Title	U.S. Patent and Trademark Office Awards Patent for Method for Measuring Interference in a Memory Device
Media name/outlet	Global IP News. Measurement & Testing Patent News
Country/Territory	India
Date	22/8/3
Persons	Hyun Park, Hyun Koo Kim, Hyeon Soo Kim, Hyeoncheol Kim, Jae Sung Woo, Soo Jin Kim, Soo-young Kim