US Patent Issued to KOH YOUNG TECHNOLOGY, KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY on Dec. 20 for "Substrate inspection apparatus and method of determining fault type of screen printer" (South Korean Inventors)

Press/Media: Press / Media

Period2022 Dec 21

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  • TitleUS Patent Issued to KOH YOUNG TECHNOLOGY, KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY on Dec. 20 for "Substrate inspection apparatus and method of determining fault type of screen printer" (South Korean Inventors)
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date22/12/21
    PersonsYoung-Sun Lee, Young-sun Lee
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