Abstract
For lower reflectance, we applied a maskless plasma texturing technique using reactive ion etching (RIE) on acidic-textured multicrystalline silicon (mc-Si) wafer. RIE texturing had a deep and narrow textured surface and showed excellent low reflectance. Due to plasma-induced damage, unless the RIE-textured surfaces have the proper damage removal etching (DRE), they have a drop in Vocand FF. RIE texturing with a proper DRE had sufficiently higher short circuit current (I sc) than acidic-textured samples without a drop in open circuit voltage (Voc). And in order to improve efficiency of mc-Si solar cell, we applied RIE texturing with optimized DRE condition to selective emitter structure. In comparison with the acidic-textured solar cells, RIE-textured solar cells have above 200mA absolute gain in Isc. And optimized RIE samples with a DRE by HNO3/HF mixture showed 17.6% conversion efficiency, which were made using an industrial screen printing process with selective emitter structure.
Original language | English |
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Article number | 248182 |
Journal | International Journal of Photoenergy |
Volume | 2012 |
DOIs | |
Publication status | Published - 2012 |
Externally published | Yes |
ASJC Scopus subject areas
- Chemistry(all)
- Atomic and Molecular Physics, and Optics
- Renewable Energy, Sustainability and the Environment
- Materials Science(all)