26.3 Noise Immunity in Capacitive Sensing: Single-Ended AFE Design with Common-Current Subtraction for Mutual- and Self-Capacitance Sensing in 390pF Load

Jun Yeol An, Seung Hun Choi, Si Woo Kim, Jae Youl Lee, Hyung Min Lee, Yoon Kyung Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Today, flexible on-cell OLED displays have become the standard choice for flagship smartphones thanks to their thin form factor. However, the touch sensor integrated within the display faces several technical challenges arising from large parasitic capacitance of the touch sensor [1]. A potential solution involves subdividing the line sensors into smaller segments, arranged in a matrix configuration. However, this approach comes with higher design costs, as M×N sensors need to be controlled by the touch controller, and line sensors continue to be favored for smartphone displays. In the line sensor, one significant challenge is to mitigate the degradation of touch signal quality due to the prominent display noise coupling through the large parasitic capacitance. Also, implementing self-cap sensing (SC-sensing) poses another hurdle, which is the presence of large parasitic capacitance in the sensor that complicates matters by introducing difficulties in baseline compensation.

Original languageEnglish
Title of host publication2024 IEEE International Solid-State Circuits Conference, ISSCC 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages436-438
Number of pages3
ISBN (Electronic)9798350306200
DOIs
Publication statusPublished - 2024
Event2024 IEEE International Solid-State Circuits Conference, ISSCC 2024 - San Francisco, United States
Duration: 2024 Feb 182024 Feb 22

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
ISSN (Print)0193-6530

Conference

Conference2024 IEEE International Solid-State Circuits Conference, ISSCC 2024
Country/TerritoryUnited States
CitySan Francisco
Period24/2/1824/2/22

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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