A 1.6 v 1.4 Gbp/s/pin consumer DRAM with self-dynamic voltage scaling technique in 44 nm CMOS technology

Hyun Woo Lee, Ki Han Kim, Young Kyoung Choi, Ju Hwan Sohn, Nak Kyu Park, Kwan Weon Kim, Chulwoo Kim, Young Jung Choi, Byong Tae Chung

    Research output: Contribution to journalArticlepeer-review

    15 Citations (Scopus)

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