Abstract
Statistical process control techniques have been widely used to improve processes by reducing variations and defects. In the present paper, we propose a multivariate control chart technique based on a clustering algorithm that can effectively handle a situation in which the distribution of in-control observations is inhomogeneous. A simulation study was conducted to examine the characteristics of the proposed control chart and to compare them with Hotellings T 2 multivariate control charts that are widely used in real-world processes. Moreover, an experiment with real data from the thin film transistor liquid crystal display (TFT-LCD) manufacturing process demonstrated the effectiveness and accuracy of the proposed control chart.
Original language | English |
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Pages (from-to) | 5644-5657 |
Number of pages | 14 |
Journal | International Journal of Production Research |
Volume | 51 |
Issue number | 18 |
DOIs | |
Publication status | Published - 2013 Sept 1 |
Keywords
- Hotellings T
- TFT-LCD
- bootstrap
- clustering algorithm
- multivariate control chart
ASJC Scopus subject areas
- Strategy and Management
- Management Science and Operations Research
- Industrial and Manufacturing Engineering