A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication

Qianying Tang; Chen Zhou; Woong Choi; Gyuseong Kang; Jongsun Park; Keshab K. Parhi; Chris H. Kim

doi:10.1109/CICC.2017.7993610

A DRAM based physical unclonable function capable of generating >10³² Challenge Response Pairs per 1Kbit array for secure chip authentication

Qianying Tang, Chen Zhou, Woong Choi, Gyuseong Kang, Jongsun Park, Keshab K. Parhi, Chris H. Kim

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

19 Citations (Scopus)

Abstract

A DRAM based Physical Unclonable Function (PUF) utilizing the location of weak retention cells is demonstrated in 65nm CMOS. A new authentication scheme is proposed for the DRAM PUF where a random pattern is written to a small section of the DRAM and then retention failures are induced. To further increase the number of Challenge Response Pairs (CPRs), the data pattern including retention failures is transferred to a different memory location where additional retention failures are induced. This scheme enables more than 10³² unique CRPs from a 1Kbit array. To improve the stability of the PUF response, a zero-overhead repetitive write-back technique along with bit-masking was utilized. Voltage and temperature induced instabilities were mitigated by adjusting the read reference voltage and refresh time before each authentication operation. The proposed DRAM PUF has a bit cell area of 0.68μm².

Original language	English
Title of host publication	38th Annual Custom Integrated Circuits Conference
Subtitle of host publication	A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509051915
DOIs	https://doi.org/10.1109/CICC.2017.7993610
Publication status	Published - 2017 Jul 26
Event	38th Annual Custom Integrated Circuits Conference, CICC 2017 - Austin, United States Duration: 2017 Apr 30 → 2017 May 3

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
Volume	2017-April
ISSN (Print)	0886-5930

Other

Other	38th Annual Custom Integrated Circuits Conference, CICC 2017
Country/Territory	United States
City	Austin
Period	17/4/30 → 17/5/3

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/CICC.2017.7993610

Cite this

Tang, Q., Zhou, C., Choi, W., Kang, G., Park, J., Parhi, K. K., & Kim, C. H. (2017). A DRAM based physical unclonable function capable of generating >10³² Challenge Response Pairs per 1Kbit array for secure chip authentication. In 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017 [7993610] (Proceedings of the Custom Integrated Circuits Conference; Vol. 2017-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2017.7993610

A DRAM based physical unclonable function capable of generating >10³² Challenge Response Pairs per 1Kbit array for secure chip authentication. / Tang, Qianying; Zhou, Chen; Choi, Woong et al.
38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 7993610 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2017-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tang, Q, Zhou, C, Choi, W, Kang, G, Park, J, Parhi, KK & Kim, CH 2017, A DRAM based physical unclonable function capable of generating >10³² Challenge Response Pairs per 1Kbit array for secure chip authentication. in 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017., 7993610, Proceedings of the Custom Integrated Circuits Conference, vol. 2017-April, Institute of Electrical and Electronics Engineers Inc., 38th Annual Custom Integrated Circuits Conference, CICC 2017, Austin, United States, 17/4/30. https://doi.org/10.1109/CICC.2017.7993610

Tang Q, Zhou C, Choi W, Kang G, Park J, Parhi KK et al. A DRAM based physical unclonable function capable of generating >10³² Challenge Response Pairs per 1Kbit array for secure chip authentication. In 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc. 2017. 7993610. (Proceedings of the Custom Integrated Circuits Conference). doi: 10.1109/CICC.2017.7993610

Tang, Qianying ; Zhou, Chen ; Choi, Woong et al. / A DRAM based physical unclonable function capable of generating >10³² Challenge Response Pairs per 1Kbit array for secure chip authentication. 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. (Proceedings of the Custom Integrated Circuits Conference).

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abstract = "A DRAM based Physical Unclonable Function (PUF) utilizing the location of weak retention cells is demonstrated in 65nm CMOS. A new authentication scheme is proposed for the DRAM PUF where a random pattern is written to a small section of the DRAM and then retention failures are induced. To further increase the number of Challenge Response Pairs (CPRs), the data pattern including retention failures is transferred to a different memory location where additional retention failures are induced. This scheme enables more than 1032 unique CRPs from a 1Kbit array. To improve the stability of the PUF response, a zero-overhead repetitive write-back technique along with bit-masking was utilized. Voltage and temperature induced instabilities were mitigated by adjusting the read reference voltage and refresh time before each authentication operation. The proposed DRAM PUF has a bit cell area of 0.68μm2.",

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