This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.
Bibliographical noteFunding Information:
This work was financially supported by the Tera-level Nano-Dvices (TND) Program of the Ministry of Science and Technology and National Research Foundation of Korea (NRF, Grant No. 2009-0083380) funded by the Ministry of Education, Science, and Technology (WCU R32-2010-000-10082-0, Converging Research Center Program, 2010K000981 and No. 2005-2002369) and the Korea Student Aid Foundation (KOSAF) grant funded by the Korea Government (MEST) (Grant No. S2-2009-000-00991-1).
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