A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

Min Kyu Joo; Pilsoo Kang; Yongha Kim; Gyu Tae Kim; Sangtae Kim

doi:10.1063/1.3553208

A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

Min Kyu Joo, Pilsoo Kang, Yongha Kim, Gyu Tae Kim, Sangtae Kim

Research output: Contribution to journal › Article › peer-review

28 Citations (Scopus)

Abstract

This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.

Original language	English
Article number	034702
Journal	Review of Scientific Instruments
Volume	82
Issue number	3
DOIs	https://doi.org/10.1063/1.3553208
Publication status	Published - 2011 Mar

Bibliographical note

Funding Information:
This work was financially supported by the Tera-level Nano-Dvices (TND) Program of the Ministry of Science and Technology and National Research Foundation of Korea (NRF, Grant No. 2009-0083380) funded by the Ministry of Education, Science, and Technology (WCU R32-2010-000-10082-0, Converging Research Center Program, 2010K000981 and No. 2005-2002369) and the Korea Student Aid Foundation (KOSAF) grant funded by the Korea Government (MEST) (Grant No. S2-2009-000-00991-1).

ASJC Scopus subject areas

Instrumentation

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title = "A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices",

abstract = "This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.",

author = "Joo, {Min Kyu} and Pilsoo Kang and Yongha Kim and Kim, {Gyu Tae} and Sangtae Kim",

note = "Funding Information: This work was financially supported by the Tera-level Nano-Dvices (TND) Program of the Ministry of Science and Technology and National Research Foundation of Korea (NRF, Grant No. 2009-0083380) funded by the Ministry of Education, Science, and Technology (WCU R32-2010-000-10082-0, Converging Research Center Program, 2010K000981 and No. 2005-2002369) and the Korea Student Aid Foundation (KOSAF) grant funded by the Korea Government (MEST) (Grant No. S2-2009-000-00991-1).",

year = "2011",

month = mar,

doi = "10.1063/1.3553208",

language = "English",

volume = "82",

journal = "Review of Scientific Instruments",

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publisher = "American Institute of Physics",

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AU - Joo, Min Kyu

AU - Kang, Pilsoo

AU - Kim, Yongha

AU - Kim, Gyu Tae

AU - Kim, Sangtae

N1 - Funding Information: This work was financially supported by the Tera-level Nano-Dvices (TND) Program of the Ministry of Science and Technology and National Research Foundation of Korea (NRF, Grant No. 2009-0083380) funded by the Ministry of Education, Science, and Technology (WCU R32-2010-000-10082-0, Converging Research Center Program, 2010K000981 and No. 2005-2002369) and the Korea Student Aid Foundation (KOSAF) grant funded by the Korea Government (MEST) (Grant No. S2-2009-000-00991-1).

PY - 2011/3

Y1 - 2011/3

N2 - This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.

AB - This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.

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A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

Abstract

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