A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Seungwan Cho, Jekwan Lee, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seung Hoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul Ho Lee, Wooyoung Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

    Original languageEnglish
    Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Print)9781943580422
    Publication statusPublished - 2018 Aug 6
    Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
    Duration: 2018 May 132018 May 18

    Publication series

    Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

    Other

    Other2018 Conference on Lasers and Electro-Optics, CLEO 2018
    Country/TerritoryUnited States
    CitySan Jose
    Period18/5/1318/5/18

    Bibliographical note

    Publisher Copyright:
    © 2018 OSA.

    ASJC Scopus subject areas

    • Instrumentation
    • Atomic and Molecular Physics, and Optics

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