A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Seungwan Cho; Jekwan Lee; Soohyun Park; Hyemin Bae; Minji Noh; Beom Kim; Chihun In; Seung Hoon Yang; Sooun Lee; Seung Young Seo; Jehyun Kim; Chul Ho Lee; Wooyoung Shim; Moon Ho Jo; Dohun Kim; Hyunyong Choi

A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Seungwan Cho, Jekwan Lee, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seung Hoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul Ho Lee, Wooyoung Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781943580422
Publication status	Published - 2018 Aug 6
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 2018 May 13 → 2018 May 18

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	18/5/13 → 18/5/18

Bibliographical note

Publisher Copyright:
© 2018 OSA.

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Cho, S., Lee, J., Park, S., Bae, H., Noh, M., Kim, B., In, C., Yang, S. H., Lee, S., Seo, S. Y., Kim, J., Lee, C. H., Shim, W., Jo, M. H., Kim, D., & Choi, H. (2018). A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings Article 8427021 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc..

A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. / Cho, Seungwan; Lee, Jekwan; Park, Soohyun et al.
2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8427021 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cho, S, Lee, J, Park, S, Bae, H, Noh, M, Kim, B, In, C, Yang, SH, Lee, S, Seo, SY, Kim, J, Lee, CH, Shim, W, Jo, MH, Kim, D & Choi, H 2018, A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8427021, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 18/5/13.

Cho S, Lee J, Park S, Bae H, Noh M, Kim B et al. A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. 8427021. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Cho, Seungwan ; Lee, Jekwan ; Park, Soohyun et al. / A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

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abstract = "We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.",

author = "Seungwan Cho and Jekwan Lee and Soohyun Park and Hyemin Bae and Minji Noh and Beom Kim and Chihun In and Yang, {Seung Hoon} and Sooun Lee and Seo, {Seung Young} and Jehyun Kim and Lee, {Chul Ho} and Wooyoung Shim and Jo, {Moon Ho} and Dohun Kim and Hyunyong Choi",

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AU - Cho, Seungwan

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AU - Park, Soohyun

AU - Bae, Hyemin

AU - Noh, Minji

AU - Kim, Beom

AU - In, Chihun

AU - Yang, Seung Hoon

AU - Lee, Sooun

AU - Seo, Seung Young

AU - Kim, Jehyun

AU - Lee, Chul Ho

AU - Shim, Wooyoung

AU - Jo, Moon Ho

AU - Kim, Dohun

AU - Choi, Hyunyong

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AB - We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

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M3 - Conference contribution

AN - SCOPUS:85052588769

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018

Y2 - 13 May 2018 through 18 May 2018

ER -

A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Abstract

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Bibliographical note

ASJC Scopus subject areas

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Cite this