A good puncturing scheme for rate compatible low-density parity-check codes

Sunghoon Choi, Sungroh Yoon, Wonjin Sung, Hongkyu Kwon, Jun Heo

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


We consider the challenges of finding good puncturing patterns for rate-compatible low-density parity-check code (LDPC) codes over additive white Gaussian noise (AWGN) channels. Puncturing is a scheme to obtain a series of higher rate codes from a lower rate mother code. It is widely used in channel coding but it causes performance is lost compared to non-punctured LDPC codes at the same rate. Previous work, considered the role of survived check nodes in puncturing patterns. Limitations, such as single survived check node assumption and simulation-based verification, were examined. This paper analyzes the performance according to the role of multiple survived check nodes and multiple dead check nodes. Based on these analyses, we propose new algorithm to find a good puncturing pattern for LDPC codes over AWGN channels.

Original languageEnglish
Pages (from-to)455-463
Number of pages9
JournalJournal of Communications and Networks
Issue number5
Publication statusPublished - 2009 Oct


  • Block-type LDPC codes (B-LDPC)
  • Density evolution (DE)
  • Low-density parity-check code (LDPC) codes
  • Puncturing

ASJC Scopus subject areas

  • Information Systems
  • Computer Networks and Communications


Dive into the research topics of 'A good puncturing scheme for rate compatible low-density parity-check codes'. Together they form a unique fingerprint.

Cite this