Skip to main navigation
Skip to search
Skip to main content
Korea University Pure Home
Home
Profiles
Research units
Equipment
Research output
Press/Media
Search by expertise, name or affiliation
A good puncturing scheme for rate compatible low-density parity-check codes
Sunghoon Choi
, Sungroh Yoon
*
, Wonjin Sung
, Hongkyu Kwon
,
Jun Heo
*
Corresponding author for this work
Research output
:
Contribution to journal
›
Article
›
peer-review
2
Citations (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'A good puncturing scheme for rate compatible low-density parity-check codes'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Low-density Parity-check Codes
100%
Rate-compatible
100%
Check Node
100%
Punctate Pattern
75%
Additive White Gaussian Noise Channel
50%
Low Dose Rate
25%
Channel Coding
25%
High Code Rate
25%
Simulation Verification
25%
Engineering
Parity Check Code
100%
Piercing
100%
Check Node
100%
Puncturing Pattern
75%
Additive White Gaussian Noise
50%
Limitations
25%
Channel Coding
25%
Rate Code
25%
Computer Science
low-density parity-check code
100%
Additive White Gaussian Noise
50%
Channel Coding
25%