A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF

Seung Hun Choi; Jun Yeol An; Jaewoong Ahn; Jae Youl Lee; Si Woo Kim; Hyung Min Lee; Yoon Kyung Choi

doi:10.23919/VLSITechnologyandCir65189.2025.11075171

A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF

Seung Hun Choi
, Jun Yeol An
, Jaewoong Ahn
, Jae Youl Lee
, Si Woo Kim
, Hyung Min Lee
, Yoon Kyung Choi

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Flexible on-cell touch OLED displays face significant display noise challenges due to large parasitic capacitance (C_P). To address the limitations of conventional methods, this paper proposes improved common-current subtraction (CCS) incorporating common-voltage subtraction (CVS) and common-charge subtraction (CQS) techniques. CVS enhances SNR by up to 6.72 dB in self-capacitance (SC) sensing and 6.33 dB in mutual capacitance (MC) sensing, while CQS increases the operational load capacity from 390 pF to 820 pF. Fabricated in 65 nm CMOS, the proposed AFE achieves a twofold improvement in input dynamic range (DR) and consistent performance under display noise (D-noise) injection.

Original language	English
Title of host publication	2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9784863488151
DOIs	https://doi.org/10.23919/VLSITechnologyandCir65189.2025.11075171
Publication status	Published - 2025
Event	2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025 - Kyoto, Japan Duration: 2025 Jun 8 → 2025 Jun 12

Publication series

Name	Digest of Technical Papers - Symposium on VLSI Technology
ISSN (Print)	0743-1562
ISSN (Electronic)	2158-9682

Conference

Conference	2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025
Country/Territory	Japan
City	Kyoto
Period	25/6/8 → 25/6/12

Bibliographical note

Publisher Copyright:
© 2025 JSAP.

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.23919/VLSITechnologyandCir65189.2025.11075171

Cite this

Choi, S. H., An, J. Y., Ahn, J., Lee, J. Y., Kim, S. W., Lee, H. M., & Choi, Y. K. (2025). A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF. In 2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025 (Digest of Technical Papers - Symposium on VLSI Technology). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/VLSITechnologyandCir65189.2025.11075171

A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF. / Choi, Seung Hun; An, Jun Yeol; Ahn, Jaewoong et al.
2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025. Institute of Electrical and Electronics Engineers Inc., 2025. (Digest of Technical Papers - Symposium on VLSI Technology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Choi, SH, An, JY, Ahn, J, Lee, JY, Kim, SW, Lee, HM & Choi, YK 2025, A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF. in 2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025. Digest of Technical Papers - Symposium on VLSI Technology, Institute of Electrical and Electronics Engineers Inc., 2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025, Kyoto, Japan, 25/6/8. https://doi.org/10.23919/VLSITechnologyandCir65189.2025.11075171

Choi SH, An JY, Ahn J, Lee JY, Kim SW, Lee HM et al. A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF. In 2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025. Institute of Electrical and Electronics Engineers Inc. 2025. (Digest of Technical Papers - Symposium on VLSI Technology). doi: 10.23919/VLSITechnologyandCir65189.2025.11075171

Choi, Seung Hun ; An, Jun Yeol ; Ahn, Jaewoong et al. / A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF. 2025 Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2025. Institute of Electrical and Electronics Engineers Inc., 2025. (Digest of Technical Papers - Symposium on VLSI Technology).

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abstract = "Flexible on-cell touch OLED displays face significant display noise challenges due to large parasitic capacitance (CP). To address the limitations of conventional methods, this paper proposes improved common-current subtraction (CCS) incorporating common-voltage subtraction (CVS) and common-charge subtraction (CQS) techniques. CVS enhances SNR by up to 6.72 dB in self-capacitance (SC) sensing and 6.33 dB in mutual capacitance (MC) sensing, while CQS increases the operational load capacity from 390 pF to 820 pF. Fabricated in 65 nm CMOS, the proposed AFE achieves a twofold improvement in input dynamic range (DR) and consistent performance under display noise (D-noise) injection.",

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doi = "10.23919/VLSITechnologyandCir65189.2025.11075171",

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AB - Flexible on-cell touch OLED displays face significant display noise challenges due to large parasitic capacitance (CP). To address the limitations of conventional methods, this paper proposes improved common-current subtraction (CCS) incorporating common-voltage subtraction (CVS) and common-charge subtraction (CQS) techniques. CVS enhances SNR by up to 6.72 dB in self-capacitance (SC) sensing and 6.33 dB in mutual capacitance (MC) sensing, while CQS increases the operational load capacity from 390 pF to 820 pF. Fabricated in 65 nm CMOS, the proposed AFE achieves a twofold improvement in input dynamic range (DR) and consistent performance under display noise (D-noise) injection.

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A Hybrid Touch Sensing AFE with Common-CVQ (Currents, Voltages, and Charges) Subtraction to Improve Display Noise Immunity for Large Sensing Load up to 820pF

Abstract

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Bibliographical note

ASJC Scopus subject areas

Access to Document

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