A new method for evaluating postacne scarring

Jin Woong Lee, Beom Joon Kim, Myeung Nam Kim, Young Hwan Choi, Kyungrok Kim, Eenjun Hwang

    Research output: Contribution to journalLetterpeer-review

    Original languageEnglish
    Pages (from-to)384-385
    Number of pages2
    JournalSkin Research and Technology
    Volume18
    Issue number3
    DOIs
    Publication statusPublished - 2012 Aug

    ASJC Scopus subject areas

    • Dermatology

    Cite this