A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures

Q. Liang; R. Krithivasan; A. Ahmed; Y. Lu; Y. Li; J. D. Cressler; G. Niu; J. S. Rieh; G. Freeman; D. Ahlgren; A. Joseph

A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures

Q. Liang, R. Krithivasan, A. Ahmed, Y. Lu, Y. Li, J. D. Cressler, G. Niu, J. S. Rieh, G. Freeman, D. Ahlgren, A. Joseph

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2005 International Semiconductor Device Research Symposium
Pages	159-160
Number of pages	2
Publication status	Published - 2005
Event	2005 International Semiconductor Device Research Symposium - Bethesda, MD, United States Duration: 2005 Dec 7 → 2005 Dec 9

Publication series

Name	2005 International Semiconductor Device Research Symposium
Volume	2005

Other

Other	2005 International Semiconductor Device Research Symposium
Country/Territory	United States
City	Bethesda, MD
Period	05/12/7 → 05/12/9

ASJC Scopus subject areas

Engineering(all)

Cite this

Liang, Q., Krithivasan, R., Ahmed, A., Lu, Y., Li, Y., Cressler, J. D., Niu, G., Rieh, J. S., Freeman, G., Ahlgren, D., & Joseph, A. (2005). A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures. In 2005 International Semiconductor Device Research Symposium (pp. 159-160). [1596030] (2005 International Semiconductor Device Research Symposium; Vol. 2005).

A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures. / Liang, Q.; Krithivasan, R.; Ahmed, A. et al.
2005 International Semiconductor Device Research Symposium. 2005. p. 159-160 1596030 (2005 International Semiconductor Device Research Symposium; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Liang, Q, Krithivasan, R, Ahmed, A, Lu, Y, Li, Y, Cressler, JD, Niu, G, Rieh, JS, Freeman, G, Ahlgren, D & Joseph, A 2005, A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures. in 2005 International Semiconductor Device Research Symposium., 1596030, 2005 International Semiconductor Device Research Symposium, vol. 2005, pp. 159-160, 2005 International Semiconductor Device Research Symposium, Bethesda, MD, United States, 05/12/7.

@inproceedings{f6358a206456495e8dc62d81766e0921,

title = "A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures",

author = "Q. Liang and R. Krithivasan and A. Ahmed and Y. Lu and Y. Li and Cressler, {J. D.} and G. Niu and Rieh, {J. S.} and G. Freeman and D. Ahlgren and A. Joseph",

year = "2005",

language = "English",

isbn = "1424400848",

series = "2005 International Semiconductor Device Research Symposium",

pages = "159--160",

booktitle = "2005 International Semiconductor Device Research Symposium",

note = "2005 International Semiconductor Device Research Symposium ; Conference date: 07-12-2005 Through 09-12-2005",

}

TY - GEN

T1 - A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures

AU - Liang, Q.

AU - Krithivasan, R.

AU - Ahmed, A.

AU - Lu, Y.

AU - Li, Y.

AU - Cressler, J. D.

AU - Niu, G.

AU - Rieh, J. S.

AU - Freeman, G.

AU - Ahlgren, D.

AU - Joseph, A.

PY - 2005

Y1 - 2005

UR - http://www.scopus.com/inward/record.url?scp=33847226948&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33847226948&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:33847226948

SN - 1424400848

SN - 9781424400843

T3 - 2005 International Semiconductor Device Research Symposium

SP - 159

EP - 160

BT - 2005 International Semiconductor Device Research Symposium

T2 - 2005 International Semiconductor Device Research Symposium

Y2 - 7 December 2005 through 9 December 2005

ER -

A new negative-differential-resistance effect in 350 GHz SiGe HBTs operating at cryogenic temperatures

Publication series

Other

ASJC Scopus subject areas

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Cite this