The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.
|Title of host publication||2017 IEEE International Conference on Consumer Electronics, ICCE 2017|
|Editors||Daniel Diaz Sanchez, Jong-Hyouk Lee, Fernando Pescador|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|Publication status||Published - 2017 Mar 29|
|Event||2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States|
Duration: 2017 Jan 8 → 2017 Jan 10
|Name||2017 IEEE International Conference on Consumer Electronics, ICCE 2017|
|Other||2017 IEEE International Conference on Consumer Electronics, ICCE 2017|
|Period||17/1/8 → 17/1/10|
Bibliographical notePublisher Copyright:
© 2017 IEEE.
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering