A novel burn-in potential region detection method using image processing technique

Yong Goo Shin; Dae Hong Lee; Mun Cheon Kang; Jeisung Lee; Sung Jea Ko

doi:10.1109/ICCE.2017.7889289

A novel burn-in potential region detection method using image processing technique

Yong Goo Shin, Dae Hong Lee, Mun Cheon Kang, Jeisung Lee, Sung Jea Ko

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.

Original language	English
Title of host publication	2017 IEEE International Conference on Consumer Electronics, ICCE 2017
Editors	Daniel Diaz Sanchez, Jong-Hyouk Lee, Fernando Pescador
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	215-216
Number of pages	2
ISBN (Electronic)	9781509055449
DOIs	https://doi.org/10.1109/ICCE.2017.7889289
Publication status	Published - 2017 Mar 29
Event	2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States Duration: 2017 Jan 8 → 2017 Jan 10

Publication series

Name	2017 IEEE International Conference on Consumer Electronics, ICCE 2017

Other

Other	2017 IEEE International Conference on Consumer Electronics, ICCE 2017
Country/Territory	United States
City	Las Vegas
Period	17/1/8 → 17/1/10

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

ASJC Scopus subject areas

Computer Networks and Communications
Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/ICCE.2017.7889289

Cite this

Shin, Y. G., Lee, D. H., Kang, M. C., Lee, J., & Ko, S. J. (2017). A novel burn-in potential region detection method using image processing technique. In D. D. Sanchez, J.-H. Lee, & F. Pescador (Eds.), 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 (pp. 215-216). Article 7889289 (2017 IEEE International Conference on Consumer Electronics, ICCE 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE.2017.7889289

A novel burn-in potential region detection method using image processing technique. / Shin, Yong Goo; Lee, Dae Hong; Kang, Mun Cheon et al.
2017 IEEE International Conference on Consumer Electronics, ICCE 2017. ed. / Daniel Diaz Sanchez; Jong-Hyouk Lee; Fernando Pescador. Institute of Electrical and Electronics Engineers Inc., 2017. p. 215-216 7889289 (2017 IEEE International Conference on Consumer Electronics, ICCE 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Shin, YG, Lee, DH, Kang, MC, Lee, J & Ko, SJ 2017, A novel burn-in potential region detection method using image processing technique. in DD Sanchez, J-H Lee & F Pescador (eds), 2017 IEEE International Conference on Consumer Electronics, ICCE 2017., 7889289, 2017 IEEE International Conference on Consumer Electronics, ICCE 2017, Institute of Electrical and Electronics Engineers Inc., pp. 215-216, 2017 IEEE International Conference on Consumer Electronics, ICCE 2017, Las Vegas, United States, 17/1/8. https://doi.org/10.1109/ICCE.2017.7889289

Shin YG, Lee DH, Kang MC, Lee J, Ko SJ. A novel burn-in potential region detection method using image processing technique. In Sanchez DD, Lee JH, Pescador F, editors, 2017 IEEE International Conference on Consumer Electronics, ICCE 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 215-216. 7889289. (2017 IEEE International Conference on Consumer Electronics, ICCE 2017). doi: 10.1109/ICCE.2017.7889289

Shin, Yong Goo ; Lee, Dae Hong ; Kang, Mun Cheon et al. / A novel burn-in potential region detection method using image processing technique. 2017 IEEE International Conference on Consumer Electronics, ICCE 2017. editor / Daniel Diaz Sanchez ; Jong-Hyouk Lee ; Fernando Pescador. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 215-216 (2017 IEEE International Conference on Consumer Electronics, ICCE 2017).

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title = "A novel burn-in potential region detection method using image processing technique",

abstract = "The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.",

author = "Shin, {Yong Goo} and Lee, {Dae Hong} and Kang, {Mun Cheon} and Jeisung Lee and Ko, {Sung Jea}",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 ; Conference date: 08-01-2017 Through 10-01-2017",

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AB - The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.

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A novel burn-in potential region detection method using image processing technique

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