A novel burn-in potential region detection method using image processing technique

Yong Goo Shin, Dae Hong Lee, Mun Cheon Kang, Jeisung Lee, Sung Jea Ko

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.

    Original languageEnglish
    Title of host publication2017 IEEE International Conference on Consumer Electronics, ICCE 2017
    EditorsDaniel Diaz Sanchez, Jong-Hyouk Lee, Fernando Pescador
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages215-216
    Number of pages2
    ISBN (Electronic)9781509055449
    DOIs
    Publication statusPublished - 2017 Mar 29
    Event2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States
    Duration: 2017 Jan 82017 Jan 10

    Publication series

    Name2017 IEEE International Conference on Consumer Electronics, ICCE 2017

    Other

    Other2017 IEEE International Conference on Consumer Electronics, ICCE 2017
    Country/TerritoryUnited States
    CityLas Vegas
    Period17/1/817/1/10

    Bibliographical note

    Publisher Copyright:
    © 2017 IEEE.

    ASJC Scopus subject areas

    • Computer Networks and Communications
    • Electrical and Electronic Engineering
    • Instrumentation

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