A Novel Quality Assessment Method for Flat Panel Display Defects

Hoon Kim, Heon Gu, Young Hyun Kim, Kang A. Choi, Sung-Jea Ko

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    This paper presents a novel quality assessment method for flat panel display (FPD) defects, often called Muras, that employs the characteristics of the human visual system (HVS). Given a Mura image, the brightness difference between the Mura and its surrounding region is first adjusted to reflect the HVS's property of background-adaptive perception. Then, the resulting adjusted Mura image is further processed using multiscale defect saliency acquisition (MDSA) to obtain a final Mura image with human perception characteristics. In the experiments, the quality scores of Mura test images are measured using the conventional and proposed methods. The results demonstrate that the quality of Mura evaluated by the proposed method correlates with the subjective quality to a much higher degree compared with the conventional methods.

    Original languageEnglish
    Article number7368869
    Pages (from-to)500-505
    Number of pages6
    JournalIEEE/OSA Journal of Display Technology
    Volume12
    Issue number5
    DOIs
    Publication statusPublished - 2016 May 1

    Keywords

    • Human visual system (HVS)
    • Mura
    • perceptual defect assessment
    • Visual saliency

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

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