TY - GEN
T1 - A novel ultrafine particle mesurement system with an electrometer
AU - Park, Sang Soo
AU - Lee, Chang Jin
AU - Kim, Soo Won
AU - Lee, Seung Bok
AU - Bae, Gwi Nam
AU - Moon, Kil Choo
PY - 2005
Y1 - 2005
N2 - In this study, a novel ultra fine particle measurement system using condensation and charging techniques was proposed. It consisted of the inlet / size separation part for selecting particles in the bounded-size range, a uniform growth unit for deriving the condensation of ultra fine particles, an aerosol charger for charging particles grown uniformly in the growth unit, a Faraday cage / ammeter part for measuring ultra low current about 10 -13 A induced by charged-particles collected on the filter in Faraday cage, and a communication network part for monitoring particle data in real time. The particle phenomena occurred in major components of the ultra fine particle measurement system was introduced and the ammeter circuit used in this work was described in detail. The performance of the prototype ammeter was comparable with a commercial one.
AB - In this study, a novel ultra fine particle measurement system using condensation and charging techniques was proposed. It consisted of the inlet / size separation part for selecting particles in the bounded-size range, a uniform growth unit for deriving the condensation of ultra fine particles, an aerosol charger for charging particles grown uniformly in the growth unit, a Faraday cage / ammeter part for measuring ultra low current about 10 -13 A induced by charged-particles collected on the filter in Faraday cage, and a communication network part for monitoring particle data in real time. The particle phenomena occurred in major components of the ultra fine particle measurement system was introduced and the ammeter circuit used in this work was described in detail. The performance of the prototype ammeter was comparable with a commercial one.
UR - http://www.scopus.com/inward/record.url?scp=33847143734&partnerID=8YFLogxK
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U2 - 10.1109/MWSCAS.2005.1594080
DO - 10.1109/MWSCAS.2005.1594080
M3 - Conference contribution
AN - SCOPUS:33847143734
SN - 0780391977
SN - 9780780391970
T3 - Midwest Symposium on Circuits and Systems
SP - 227
EP - 230
BT - 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
T2 - 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
Y2 - 7 August 2005 through 10 August 2005
ER -