A Radiation-Hardened Readout Integrated Circuits for Sensor Systems

Minseong Um; Duckhoon Ro; Ik Joon Chang; Hyung Min Lee

doi:10.1109/ICCE-Asia49877.2020.9276762

A Radiation-Hardened Readout Integrated Circuits for Sensor Systems

Minseong Um, Duckhoon Ro, Ik Joon Chang, Hyung Min Lee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Radiation-hardened IA and ADC circuits are essential for a safe and efficient sensor system. In this paper, three-op-amp IA and SAR ADC were designed using radiation-hardened techniques and measured and proved to be robust to TID and SEE. Both Radiation-hardened IA and ADC were fabricated in a 65nm CMOS process and measured in an ARTI high-level radiation environment. The proposed IA was able to confirm that the voltage gain was accurate against TID effects in the harsh radiation environment. The proposed ADC obtained 9.59 ENOB at 5.54mW power consumption.

Original language	English
Title of host publication	2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728161648
DOIs	https://doi.org/10.1109/ICCE-Asia49877.2020.9276762
Publication status	Published - 2020 Nov 1
Event	2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020 - Seoul, Korea, Republic of Duration: 2020 Nov 1 → 2020 Nov 3

Publication series

Name	2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020

Conference

Conference	2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020
Country/Territory	Korea, Republic of
City	Seoul
Period	20/11/1 → 20/11/3

Bibliographical note

Funding Information:
This research was supported by the National R&D Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science & ICT (NRF-2017M1A7A1A01016260). The chip fabrication and EDA tool were supported by the IC Design Education Center (IDEC), Korea.

Publisher Copyright:
© 2020 IEEE.

Keywords

Instrumentation amplifier
Radiation-hardened
SAR ADC
Sensor Readout IC
Single event effect
Soft error
Total ionizing dose

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering
Media Technology
Instrumentation

Access to Document

10.1109/ICCE-Asia49877.2020.9276762

Cite this

Um, M., Ro, D., Chang, I. J., & Lee, H. M. (2020). A Radiation-Hardened Readout Integrated Circuits for Sensor Systems. In 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020 Article 9276762 (2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-Asia49877.2020.9276762

A Radiation-Hardened Readout Integrated Circuits for Sensor Systems. / Um, Minseong; Ro, Duckhoon; Chang, Ik Joon et al.
2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9276762 (2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Um, M, Ro, D, Chang, IJ & Lee, HM 2020, A Radiation-Hardened Readout Integrated Circuits for Sensor Systems. in 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020., 9276762, 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020, Institute of Electrical and Electronics Engineers Inc., 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020, Seoul, Korea, Republic of, 20/11/1. https://doi.org/10.1109/ICCE-Asia49877.2020.9276762

Um M, Ro D, Chang IJ, Lee HM. A Radiation-Hardened Readout Integrated Circuits for Sensor Systems. In 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9276762. (2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020). doi: 10.1109/ICCE-Asia49877.2020.9276762

@inproceedings{a8eb84f9995647a2b3ba8a917c74adda,

title = "A Radiation-Hardened Readout Integrated Circuits for Sensor Systems",

abstract = "Radiation-hardened IA and ADC circuits are essential for a safe and efficient sensor system. In this paper, three-op-amp IA and SAR ADC were designed using radiation-hardened techniques and measured and proved to be robust to TID and SEE. Both Radiation-hardened IA and ADC were fabricated in a 65nm CMOS process and measured in an ARTI high-level radiation environment. The proposed IA was able to confirm that the voltage gain was accurate against TID effects in the harsh radiation environment. The proposed ADC obtained 9.59 ENOB at 5.54mW power consumption.",

keywords = "Instrumentation amplifier, Radiation-hardened, SAR ADC, Sensor Readout IC, Single event effect, Soft error, Total ionizing dose",

author = "Minseong Um and Duckhoon Ro and Chang, {Ik Joon} and Lee, {Hyung Min}",

note = "Funding Information: This research was supported by the National R&D Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science & ICT (NRF-2017M1A7A1A01016260). The chip fabrication and EDA tool were supported by the IC Design Education Center (IDEC), Korea. Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020 ; Conference date: 01-11-2020 Through 03-11-2020",

year = "2020",

month = nov,

day = "1",

doi = "10.1109/ICCE-Asia49877.2020.9276762",

language = "English",

series = "2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020",

}

TY - GEN

T1 - A Radiation-Hardened Readout Integrated Circuits for Sensor Systems

AU - Um, Minseong

AU - Ro, Duckhoon

AU - Chang, Ik Joon

AU - Lee, Hyung Min

N1 - Funding Information: This research was supported by the National R&D Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science & ICT (NRF-2017M1A7A1A01016260). The chip fabrication and EDA tool were supported by the IC Design Education Center (IDEC), Korea. Publisher Copyright: © 2020 IEEE.

PY - 2020/11/1

Y1 - 2020/11/1

N2 - Radiation-hardened IA and ADC circuits are essential for a safe and efficient sensor system. In this paper, three-op-amp IA and SAR ADC were designed using radiation-hardened techniques and measured and proved to be robust to TID and SEE. Both Radiation-hardened IA and ADC were fabricated in a 65nm CMOS process and measured in an ARTI high-level radiation environment. The proposed IA was able to confirm that the voltage gain was accurate against TID effects in the harsh radiation environment. The proposed ADC obtained 9.59 ENOB at 5.54mW power consumption.

AB - Radiation-hardened IA and ADC circuits are essential for a safe and efficient sensor system. In this paper, three-op-amp IA and SAR ADC were designed using radiation-hardened techniques and measured and proved to be robust to TID and SEE. Both Radiation-hardened IA and ADC were fabricated in a 65nm CMOS process and measured in an ARTI high-level radiation environment. The proposed IA was able to confirm that the voltage gain was accurate against TID effects in the harsh radiation environment. The proposed ADC obtained 9.59 ENOB at 5.54mW power consumption.

KW - Instrumentation amplifier

KW - Radiation-hardened

KW - SAR ADC

KW - Sensor Readout IC

KW - Single event effect

KW - Soft error

KW - Total ionizing dose

UR - http://www.scopus.com/inward/record.url?scp=85098869535&partnerID=8YFLogxK

U2 - 10.1109/ICCE-Asia49877.2020.9276762

DO - 10.1109/ICCE-Asia49877.2020.9276762

M3 - Conference contribution

AN - SCOPUS:85098869535

T3 - 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020

BT - 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 IEEE International Conference on Consumer Electronics - Asia, ICCE-Asia 2020

Y2 - 1 November 2020 through 3 November 2020

ER -

A Radiation-Hardened Readout Integrated Circuits for Sensor Systems

Abstract

Publication series

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Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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