A radiation-hardened SAR ADC with delay-based dual feedback flip-flops for sensor readout systems

Duckhoon Ro, Changhong Min, Myounggon Kang, Ik Joon Chang, Hyung Min Lee

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

For stable and effective control of the sensor system, analog sensor signals such as temperature, pressure, and electromagnetic fields should be accurately measured and converted to digital bits. However, radiation environments, such as space, flight, nuclear power plants, and nuclear fusion reactors, as well as high-reliability applications, such as automotive semiconductor systems, suffer from radiation effects that degrade the performance of the sensor readout system including analog-to-digital converters (ADCs) and cause system malfunctions. This paper investigates an optimal ADC structure in radiation environments and proposes a successive-approximation-register (SAR) ADC using delay-based double feedback flip-flops to enhance the system tolerance against radiation effects, including total ionizing dose (TID) and single event effects (SEE). The proposed flip-flop was fabricated using 130 nm complementary metal–oxide–semiconductor (CMOS) silicon-on-insulator (SOI) process, and its radiation tolerance was measured in actual radiation test facilities. Also, the proposed radiation-hardened SAR ADC with delay-based dual feedback flip-flops was designed and verified by utilizing compact transistor models, which reflect radiation effects to CMOS parameters, and radiation simulator computer aided design (CAD) tools.

Original languageEnglish
Article number171
JournalSensors (Switzerland)
Volume20
Issue number1
DOIs
Publication statusPublished - 2020 Jan 1

Bibliographical note

Funding Information:
Author Contributions: Methodology, validation, D.R. and C.M.; writing paper, D.R.; conceptualization, funding acquisition, investigation, M.K., I.J.C. and H.-M.L.; supervision, writing—review and editing, H.-M.L. All authors AhauvtheoreradCoanntdriabgurteieodntso: tMheetphuobdloislhoegdy,v evrasliiodnatoiofnth, eDm.Ran. uasncdri pCt..M.; writing paper, D.R.; conceptualization, funding acquisition, investigation, M.K., I.J.C. and H.-M.L.; supervision, writing—review and editing, H.-M.L. of Korea (NRF) funded by the Ministry of Science & ICT (NRF-2017M1A7A1A01016260). This research was also Funding: This research was supported by the National R&D Program through the National Research supported by the National R&D Program through the National Research Foundation of Korea (NRF) funded by Foundation of Korea (the Ministry of ScienceN&RF) ICTfunded by the(NRF-2017M1A7A1A01016257).Ministry of Science & ICT (NRF-2017M1A7A1A01016260). This research was also supported by the National R&D Program through the National Research Foundation of Korea Acknowledgments: The EDA tool was supported by the IC Design Education Center (IDEC), Korea. (NRF) funded by the Ministry of Science & ICT (NRF-2017M1A7A1A01016257). Conflicts of Interest: The authors declare no conflict of interest. Acknowledgment: The EDA tool was supported by the IC Design Education Center (IDEC), Korea.

Publisher Copyright:
© 2019 by the authors. Licensee MDPI, Basel, Switzerland.

Keywords

  • Compact model
  • Flip-flop
  • Radiation-hardened
  • SAR ADC
  • SEE
  • Soft error
  • TID

ASJC Scopus subject areas

  • Analytical Chemistry
  • Biochemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electrical and Electronic Engineering

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