TY - GEN
T1 - A robust contrast enhancement method for automatic TFT-LCD module inspection
AU - Kim, Jinkyu
AU - Kim, Jinkoo
AU - Seo, Jeonghoon
AU - Oh, Euiyeol
PY - 2011
Y1 - 2011
N2 - An automated detection of defect in TFT-LCD manufacturing is critical to maintain high-quality TFT-LCD production. However, various types of defect and their low SNR make it challenging, and therefore fully automated defect detection is still unresolved. In this paper, we propose a robust method for defect detection combining high-resolution image acquisition technique and image processing techniques. The proposed method shows significantly improved performance in defect detection enough to detect undergray (≤1gray) defect.
AB - An automated detection of defect in TFT-LCD manufacturing is critical to maintain high-quality TFT-LCD production. However, various types of defect and their low SNR make it challenging, and therefore fully automated defect detection is still unresolved. In this paper, we propose a robust method for defect detection combining high-resolution image acquisition technique and image processing techniques. The proposed method shows significantly improved performance in defect detection enough to detect undergray (≤1gray) defect.
UR - http://www.scopus.com/inward/record.url?scp=84860868299&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84860868299
SN - 9781618396006
T3 - SID Conference Record of the International Display Research Conference
SP - 53
EP - 55
BT - 31st International Display Research Conference 2011, EuroDisplay 2011
T2 - 31st International Display Research Conference 2011, EuroDisplay 2011
Y2 - 19 September 2011 through 22 September 2011
ER -