A soft-error-tolerant sar adc with dual-capacitor sample-and-hold control for sensor systems

Duckhoon Ro; Minseong Um; Hyung Min Lee

doi:10.3390/s21144768

A soft-error-tolerant sar adc with dual-capacitor sample-and-hold control for sensor systems

Duckhoon Ro, Minseong Um, Hyung Min Lee

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

For a reliable and stable sensor system, it is essential to precisely measure various sensor signals, such as electromagnetic field, pressure, and temperature. The measured analog signal is converted into digital bits through the sensor readout system. However, in extreme radiation environments, such as in space, during flights, and in nuclear fusion reactors, the performance of the analog-to-digital converter (ADC) constituting the sensor readout system can be degraded due to soft errors caused by radiation effects, leading to system malfunction. This paper proposes a soft-errortolerant successive-approximation-register (SAR) ADC using dual-capacitor sample-and-hold (S/H) control, which has robust characteristics against total ionizing dose (TID) and single event effects (SEE). The proposed ADC was fabricated using 65-nm CMOS process, and its soft-error-tolerant performance was measured in radiation environments. Additionally, the proposed circuit techniques were verified by utilizing a radiation simulator CAD tool.

Original language	English
Article number	4768
Journal	Sensors
Volume	21
Issue number	14
DOIs	https://doi.org/10.3390/s21144768
Publication status	Published - 2021 Jul 2

Bibliographical note

Funding Information:
Acknowledgments: The EDA tool and chip fabrication were supported by the IC Design Education Center (IDEC), Korea.

Funding Information:
Funding: This research was supported by the National R&D Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science & ICT (NRF-2020M3F3A2A01081777).

Publisher Copyright:
© 2021 by the authors. Licensee MDPI, Basel, Switzerland.

Keywords

Radiation-hardened
SAR ADC
Sample-and-hold
Sensor system
Single event effect
Soft-error
Total ionizing dose

ASJC Scopus subject areas

Analytical Chemistry
Information Systems
Atomic and Molecular Physics, and Optics
Biochemistry
Instrumentation
Electrical and Electronic Engineering

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10.3390/s21144768

Cite this

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abstract = "For a reliable and stable sensor system, it is essential to precisely measure various sensor signals, such as electromagnetic field, pressure, and temperature. The measured analog signal is converted into digital bits through the sensor readout system. However, in extreme radiation environments, such as in space, during flights, and in nuclear fusion reactors, the performance of the analog-to-digital converter (ADC) constituting the sensor readout system can be degraded due to soft errors caused by radiation effects, leading to system malfunction. This paper proposes a soft-errortolerant successive-approximation-register (SAR) ADC using dual-capacitor sample-and-hold (S/H) control, which has robust characteristics against total ionizing dose (TID) and single event effects (SEE). The proposed ADC was fabricated using 65-nm CMOS process, and its soft-error-tolerant performance was measured in radiation environments. Additionally, the proposed circuit techniques were verified by utilizing a radiation simulator CAD tool.",

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A soft-error-tolerant sar adc with dual-capacitor sample-and-hold control for sensor systems

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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