A study on CeO₂ buffer layer on biaxially textured Ni-3%w substrate deposited by electron beam evaporation with high deposition rate

Engineering & Materials Science

• Buffer layers 92%
• Deposition rates 83%
• Cerium oxide 82%
• Electron beams 76%
• Evaporation 64%
• Substrates 45%
• Textures 17%
• Epitaxial films 16%
• Epitaxial growth 15%
• Cracks 14%
• Nucleation 11%
• Thermal expansion 11%
• Surface roughness 8%
• Metals 6%
• Temperature 4%
• Costs 4%

Chemical Compounds

• Electron Beam Evaporation 100%
• Conductor 65%
• Crystalline Texture 63%
• Epitaxial Film 46%
• Buffer Solution 42%
• Epitaxial Growth 39%
• Thermal Expansion Coefficient 37%
• Surface Roughness 32%
• Nucleation 26%
• Metal 14%
• Surface 10%