A study on static analysis model of mobile application for privacy protection

Seil Kim, Jae Ik Cho, Hee Won Myeong, Dong Hoon Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Citations (Scopus)

Abstract

Since mobile application market drastically extended, there have been many problems related to proliferative malicious applications that leak user's private information stored in own smart device. In Korea, government strives to protect smart device users from these problems and to establish legal basis through 'Privacy Act' as a preceding step but studies on analysis models and verification tools for mobile application have not yet much developed. The purpose of this research is to suggest an analysis system to prevent propagation of harmful applications, which compromise the user's personal information, by extracting signatures from malicious code samples detected in Android. Maliciousness of the applications has determined by learning their parsing information on the components such as DEX, Manifest, SO etc.

Original languageEnglish
Title of host publicationComputer Science and Convergence, CSA 2011 and WCC 2011 Proceedings
Pages529-540
Number of pages12
DOIs
Publication statusPublished - 2012
Event3rd International Conference on Computer Science and Its Applications, CSA 2011 and 2011 FTRA World Convergence Conference, WCC 2011 - Jeju, Korea, Republic of
Duration: 2011 Dec 122011 Dec 15

Publication series

NameLecture Notes in Electrical Engineering
Volume114 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Other

Other3rd International Conference on Computer Science and Its Applications, CSA 2011 and 2011 FTRA World Convergence Conference, WCC 2011
Country/TerritoryKorea, Republic of
CityJeju
Period11/12/1211/12/15

Bibliographical note

Funding Information:
This work was supported by the IT R&D program of MKE/KEIT [KI0038421, Develop method and apparatus for diagnosing malicious mobile program and protecting solution].

Keywords

  • Android
  • Privacy
  • Signature
  • Static analysis

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

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