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A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy
Yoonmook Kang, Jae Ho Yun, Kyung Hoon Yoon, K. S. Jeon, Yung Doug Suh, Donghwan Kim
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution