A Visual Explorer for Analyzing Trajectory Patterns

Wooil Kim; Changbeom Shim; Ilhyun Suh; Yon Dohn Chung

doi:10.1109/VAST.2017.8585462

A Visual Explorer for Analyzing Trajectory Patterns

Wooil Kim, Changbeom Shim, Ilhyun Suh, Yon Dohn Chung

Department of Computer Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

In this paper, we propose a web-based interactive visual analytic system effective for revealing the trajectory patterns. We describe the analysis approach with the data of MC1 of the VAST challenge 2017. Index Terms - Visual analytics, Information visualization.

Original language	English
Title of host publication	2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings
Editors	Brian Fisher, Shixia Liu, Tobias Schreck
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	199-200
Number of pages	2
ISBN (Electronic)	9781538631638
DOIs	https://doi.org/10.1109/VAST.2017.8585462
Publication status	Published - 2017 Jul 2
Event	2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Phoenix, United States Duration: 2017 Oct 1 → 2017 Oct 6

Publication series

Name	2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings

Other

Other	2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017
Country/Territory	United States
City	Phoenix
Period	17/10/1 → 17/10/6

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean Government (MSIP) (No. NRF-2014R1A2A1A11053657)

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean Government (MSIP) (No. NRF-2014R1A2A1A11053657).

Publisher Copyright:
© 2017 IEEE.

Keywords

Information visualization
Visual analytics

ASJC Scopus subject areas

Computer Graphics and Computer-Aided Design
Human-Computer Interaction
Information Systems
Media Technology

Access to Document

10.1109/VAST.2017.8585462

Cite this

Kim, W., Shim, C., Suh, I., & Chung, Y. D. (2017). A Visual Explorer for Analyzing Trajectory Patterns. In B. Fisher, S. Liu, & T. Schreck (Eds.), 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings (pp. 199-200). Article 8585462 (2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VAST.2017.8585462

A Visual Explorer for Analyzing Trajectory Patterns. / Kim, Wooil; Shim, Changbeom; Suh, Ilhyun et al.
2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings. ed. / Brian Fisher; Shixia Liu; Tobias Schreck. Institute of Electrical and Electronics Engineers Inc., 2017. p. 199-200 8585462 (2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, W, Shim, C, Suh, I & Chung, YD 2017, A Visual Explorer for Analyzing Trajectory Patterns. in B Fisher, S Liu & T Schreck (eds), 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings., 8585462, 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 199-200, 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017, Phoenix, United States, 17/10/1. https://doi.org/10.1109/VAST.2017.8585462

Kim W, Shim C, Suh I, Chung YD. A Visual Explorer for Analyzing Trajectory Patterns. In Fisher B, Liu S, Schreck T, editors, 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. p. 199-200. 8585462. (2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings). doi: 10.1109/VAST.2017.8585462

Kim, Wooil ; Shim, Changbeom ; Suh, Ilhyun et al. / A Visual Explorer for Analyzing Trajectory Patterns. 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings. editor / Brian Fisher ; Shixia Liu ; Tobias Schreck. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 199-200 (2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings).

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abstract = "In this paper, we propose a web-based interactive visual analytic system effective for revealing the trajectory patterns. We describe the analysis approach with the data of MC1 of the VAST challenge 2017. Index Terms - Visual analytics, Information visualization.",

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author = "Wooil Kim and Changbeom Shim and Ilhyun Suh and Chung, {Yon Dohn}",

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A Visual Explorer for Analyzing Trajectory Patterns

Abstract

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Bibliographical note

Keywords

ASJC Scopus subject areas

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