A waveform distortion evaluation method based on a simple Half-Cycle RMS calculation

Soo Hwan Cho, Chang Hyun Park, Jonghoon Han, Gilsoo Jang

    Research output: Contribution to journalArticlepeer-review

    19 Citations (Scopus)

    Abstract

    This paper presents a simple and efficient power-quality (PQ) evaluation method based on the half-cycle root-mean-square (H-RMS) calculation, which can be easily applied to waveform distortions processed from instantaneous values. PQ disturbances, especially related to voltage magnitude variations, can be generally divided into two categories by the measuring method: One is the rms-based PQ events, which include voltage sag, swell, undervoltage, overvoltage, and interruption, which are defined by the magnitude variations in terms of rms values. The other is the instantaneous value-based PQ events, which include transient, noise, harmonics, interharmonics, and flicker (or voltage fluctuation), some of which are assessed by the raw data or processed through frequency analysis and filtering. According to the fundamental characteristic and definition of each PQ event, the acquired signal data should be processed through the different routes. This study shows that the H-RMS-based measuring process can be usefully applied to quantify the instantaneous value-based PQ events, especially in regards to waveform distortions, such as harmonic distortion and flicker, which can be assessed by the IEC flicker severity index (P st) and the equivalent 10-Hz flicker index (Δ V 10).

    Original languageEnglish
    Article number6185714
    Pages (from-to)1461-1467
    Number of pages7
    JournalIEEE Transactions on Power Delivery
    Volume27
    Issue number3
    DOIs
    Publication statusPublished - 2012

    Bibliographical note

    Funding Information:
    Manuscript received July 28, 2011; revised November 15, 2011; accepted February 29, 2012. Date of publication April 17, 2012; date of current version June 20, 2012. This work was supported in part by the Sangmyung University Research Foundation and in part by the KETEP Human Resources Development funded by the Korea Ministry of Knowledge Economy (No. 20114010203010-11-1-000). Paper no. TPWRD-00642-2011.

    Keywords

    • Envelope signal
    • IEC flickermeter
    • half-cycle-root mean square (H-RMS)
    • total harmonics
    • voltage fluctuation

    ASJC Scopus subject areas

    • Energy Engineering and Power Technology
    • Electrical and Electronic Engineering

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