Adaptive ECC for Tailored Protection of Nanoscale Memory

Dongyeob Shin; Jongsun Park; Jangwon Park; Somnath Paul; Swarup Bhunia

doi:10.1109/MDAT.2016.2615844

Adaptive ECC for Tailored Protection of Nanoscale Memory

Dongyeob Shin, Jongsun Park, Jangwon Park, Somnath Paul, Swarup Bhunia

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Editors note:Following technology scaling, runtime failure has emerged as one of the major challenges in modern VLSI designs under the increased parametric variability and low supply voltage. This issue is especially severe in nanoscale memory due to its high density and large capacity. In this work the authors present a novel reconfigurable Error Correction Code (ECC) to improve the reliability of nanoscale memory.

Original language	English
Article number	7586136
Pages (from-to)	84-93
Number of pages	10
Journal	IEEE Design and Test
Volume	34
Issue number	6
DOIs	https://doi.org/10.1109/MDAT.2016.2615844
Publication status	Published - 2017 Dec

Bibliographical note

Publisher Copyright:
©2017 IEEE.

Keywords

Error Correction Code (ECC)
Memory Failures
Robust Nanoscale Memory
Run-time Protection
Variable ECC

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/MDAT.2016.2615844

Cite this

@article{2c4e34889458426f8eb6dceedaacd772,

title = "Adaptive ECC for Tailored Protection of Nanoscale Memory",

abstract = "Editors note:Following technology scaling, runtime failure has emerged as one of the major challenges in modern VLSI designs under the increased parametric variability and low supply voltage. This issue is especially severe in nanoscale memory due to its high density and large capacity. In this work the authors present a novel reconfigurable Error Correction Code (ECC) to improve the reliability of nanoscale memory.",

keywords = "Error Correction Code (ECC), Memory Failures, Robust Nanoscale Memory, Run-time Protection, Variable ECC",

author = "Dongyeob Shin and Jongsun Park and Jangwon Park and Somnath Paul and Swarup Bhunia",

note = "Publisher Copyright: {\textcopyright}2017 IEEE.",

year = "2017",

month = dec,

doi = "10.1109/MDAT.2016.2615844",

language = "English",

volume = "34",

pages = "84--93",

journal = "IEEE Design and Test",

issn = "2168-2356",

publisher = "IEEE Computer Society",

number = "6",

}

TY - JOUR

T1 - Adaptive ECC for Tailored Protection of Nanoscale Memory

AU - Shin, Dongyeob

AU - Park, Jongsun

AU - Park, Jangwon

AU - Paul, Somnath

AU - Bhunia, Swarup

PY - 2017/12

Y1 - 2017/12

N2 - Editors note:Following technology scaling, runtime failure has emerged as one of the major challenges in modern VLSI designs under the increased parametric variability and low supply voltage. This issue is especially severe in nanoscale memory due to its high density and large capacity. In this work the authors present a novel reconfigurable Error Correction Code (ECC) to improve the reliability of nanoscale memory.

AB - Editors note:Following technology scaling, runtime failure has emerged as one of the major challenges in modern VLSI designs under the increased parametric variability and low supply voltage. This issue is especially severe in nanoscale memory due to its high density and large capacity. In this work the authors present a novel reconfigurable Error Correction Code (ECC) to improve the reliability of nanoscale memory.

KW - Error Correction Code (ECC)

KW - Memory Failures

KW - Robust Nanoscale Memory

KW - Run-time Protection

KW - Variable ECC

UR - http://www.scopus.com/inward/record.url?scp=85037732215&partnerID=8YFLogxK

U2 - 10.1109/MDAT.2016.2615844

DO - 10.1109/MDAT.2016.2615844

M3 - Article

AN - SCOPUS:85037732215

SN - 2168-2356

VL - 34

SP - 84

EP - 93

JO - IEEE Design and Test

JF - IEEE Design and Test

IS - 6

M1 - 7586136

ER -

Adaptive ECC for Tailored Protection of Nanoscale Memory

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this