Skip to main navigation Skip to search Skip to main content

AlGaN/GaN metal-oxide-semiconductor high electron mobility transistors using Sc2O3 as the gate oxide and surface passivation

  • R. Mehandru*
  • , B. Luo
  • , J. Kim
  • , F. Ren
  • , B. P. Gila
  • , A. H. Onstine
  • , C. R. Abernathy
  • , S. J. Pearton
  • , D. Gotthold
  • , R. Birkhahn
  • , B. Peres
  • , R. Fitch
  • , J. Gillespie
  • , T. Jenkins
  • , J. Sewell
  • , D. Via
  • , A. Crespo
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'AlGaN/GaN metal-oxide-semiconductor high electron mobility transistors using Sc2O3 as the gate oxide and surface passivation'. Together they form a unique fingerprint.
Sort by

Keyphrases

Material Science

Engineering