AlGaN/GaN metal-oxide-semiconductor high electron mobility transistors using Sc2O3 as the gate oxide and surface passivation
- R. Mehandru*
- , B. Luo
- , J. Kim
- , F. Ren
- , B. P. Gila
- , A. H. Onstine
- , C. R. Abernathy
- , S. J. Pearton
- , D. Gotthold
- , R. Birkhahn
- , B. Peres
- , R. Fitch
- , J. Gillespie
- , T. Jenkins
- , J. Sewell
- , D. Via
- , A. Crespo
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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