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An Investigation of the Damage Mechanisms in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs
Chendong Zhu, Qingqing Liang, Ragad Al-Huq, John D. Cressler, Alvin Joseph, Jarle Johansen, Tianbing Chen, Guofu Niu, Greg Freeman, Jae Sung Rieh, David Ahlgren
Research output: Contribution to journal › Conference article › peer-review
8
Citations
(Scopus)