An Investigation of the Damage Mechanisms in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs
- Chendong Zhu*
- , Qingqing Liang
- , Ragad Al-Huq
- , John D. Cressler
- , Alvin Joseph
- , Jarle Johansen
- , Tianbing Chen
- , Guofu Niu
- , Greg Freeman
- , Jae Sung Rieh
- , David Ahlgren
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
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