An Investigation of the Damage Mechanisms in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs

Chendong Zhu, Qingqing Liang, Ragad Al-Huq, John D. Cressler, Alvin Joseph, Jarle Johansen, Tianbing Chen, Guofu Niu, Greg Freeman, Jae Sung Rieh, David Ahlgren

Research output: Contribution to journalConference articlepeer-review

8 Citations (Scopus)

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