TY - GEN
T1 - Analysis for radiation-resistance of InGaP and GaAs sub-cells for InGaP/GaAs/Ge 3-junction solar cells
AU - Yamaguchi, Masafumi
AU - Ekins-Daukes, Nicholas J.
AU - Lee, Hae Seok
AU - Sumita, Taishi
AU - Imaizumi, Mitsuru
AU - Takamoto, Tatsuya
AU - Agui, Takaaki
AU - Kaneiwa, Minoru
AU - Kamimura, Kunio
AU - Ohshima, Takeshi
AU - Itoh, Hisayoshi
PY - 2006
Y1 - 2006
N2 - The radiation resistance of individual InGaP and GaAs sub-cells is assessed as a function of base doping under low-energy proton irradiation. It is found that InGaP subcells with low base doping are the most radiation tolerant. However, in GaAs, carrier removal leads to a rapid degradation in sub-cells with low base doping and the most radiation hard sub-cell is achieved using a linearly graded base doping profile.
AB - The radiation resistance of individual InGaP and GaAs sub-cells is assessed as a function of base doping under low-energy proton irradiation. It is found that InGaP subcells with low base doping are the most radiation tolerant. However, in GaAs, carrier removal leads to a rapid degradation in sub-cells with low base doping and the most radiation hard sub-cell is achieved using a linearly graded base doping profile.
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U2 - 10.1109/WCPEC.2006.279838
DO - 10.1109/WCPEC.2006.279838
M3 - Conference contribution
AN - SCOPUS:41749125428
SN - 1424400163
SN - 9781424400164
T3 - Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
SP - 1789
EP - 1792
BT - Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
PB - IEEE Computer Society
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
Y2 - 7 May 2006 through 12 May 2006
ER -