Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability

Sungkyu Lee; Ho Won Lee; In Yeob Na; Han Kyu Yoo; Kyo Min Hwang; Hyun Jung Baek; Gyu Tae Kim; Young Kwan Kim

doi:10.1166/nnl.2017.2304

Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability

Sungkyu Lee, Ho Won Lee, In Yeob Na, Han Kyu Yoo, Kyo Min Hwang, Hyun Jung Baek, Gyu Tae Kim, Young Kwan Kim

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 °C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.

Original language	English
Pages (from-to)	14-19
Number of pages	6
Journal	Nanoscience and Nanotechnology Letters
Volume	9
Issue number	1
DOIs	https://doi.org/10.1166/nnl.2017.2304
Publication status	Published - 2017 Jan

Keywords

Blue phosphorescent organic light-emitting diode
Crystallization
Degradation
Orinterdiffusion
Thermal stress

ASJC Scopus subject areas

Materials Science(all)

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10.1166/nnl.2017.2304

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title = "Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability",

abstract = "We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 °C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.",

keywords = "Blue phosphorescent organic light-emitting diode, Crystallization, Degradation, Orinterdiffusion, Thermal stress",

author = "Sungkyu Lee and Lee, {Ho Won} and Na, {In Yeob} and Yoo, {Han Kyu} and Hwang, {Kyo Min} and Baek, {Hyun Jung} and Kim, {Gyu Tae} and Kim, {Young Kwan}",

note = "Funding Information: This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. 2015R1A6A1A03031833), the MSIP (Ministry of Science, ICT and Future Planning), Korea, under the ITRC (Information Technology Research Center) support program (IITC-2016-H8501-16- 1009) supervised by the IITP (Institute for Information and communications Technology Promotion). Publisher Copyright: Copyright {\textcopyright} 2017 American Scientific Publishers.",

year = "2017",

month = jan,

doi = "10.1166/nnl.2017.2304",

language = "English",

volume = "9",

pages = "14--19",

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AU - Lee, Sungkyu

AU - Lee, Ho Won

AU - Na, In Yeob

AU - Yoo, Han Kyu

AU - Hwang, Kyo Min

AU - Baek, Hyun Jung

AU - Kim, Gyu Tae

AU - Kim, Young Kwan

N1 - Funding Information: This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. 2015R1A6A1A03031833), the MSIP (Ministry of Science, ICT and Future Planning), Korea, under the ITRC (Information Technology Research Center) support program (IITC-2016-H8501-16- 1009) supervised by the IITP (Institute for Information and communications Technology Promotion). Publisher Copyright: Copyright © 2017 American Scientific Publishers.

PY - 2017/1

Y1 - 2017/1

N2 - We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 °C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.

AB - We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 °C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.

KW - Blue phosphorescent organic light-emitting diode

KW - Crystallization

KW - Degradation

KW - Orinterdiffusion

KW - Thermal stress

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SP - 14

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JO - Nanoscience and Nanotechnology Letters

JF - Nanoscience and Nanotechnology Letters

IS - 1

ER -

Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability

Abstract

Keywords

ASJC Scopus subject areas

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