Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability

Sungkyu Lee, Ho Won Lee, In Yeob Na, Han Kyu Yoo, Kyo Min Hwang, Hyun Jung Baek, Gyu Tae Kim, Young Kwan Kim

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 °C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.

Original languageEnglish
Pages (from-to)14-19
Number of pages6
JournalNanoscience and Nanotechnology Letters
Issue number1
Publication statusPublished - 2017 Jan

Bibliographical note

Funding Information:
This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (No. 2015R1A6A1A03031833), the MSIP (Ministry of Science, ICT and Future Planning), Korea, under the ITRC (Information Technology Research Center) support program (IITC-2016-H8501-16- 1009) supervised by the IITP (Institute for Information and communications Technology Promotion).

Publisher Copyright:
Copyright © 2017 American Scientific Publishers.


  • Blue phosphorescent organic light-emitting diode
  • Crystallization
  • Degradation
  • Orinterdiffusion
  • Thermal stress

ASJC Scopus subject areas

  • General Materials Science


Dive into the research topics of 'Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability'. Together they form a unique fingerprint.

Cite this