Analytical design method of high-Tc coated conductor for a resistive superconducting fault current limiter using finite element method

Young Jae Kim, Dong Keun Park, Seong Eun Yang, Won Cheol Kim, Min Cheol Ahn, Yong Soo Yoon, Na Young Kwon, Haigun Lee, Tae Kuk Ko

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

Electrical and thermal characteristics of a high-Tc superconducting (HTS) tape have close relation to a performance of a resistive type superconducting fault current limiter (SFCL). When an HTS coated conductor (CC) is applied to the SFCL, because the CC is a composite conductor, dimensions and material properties including electrical resistivity, thermal conductivity, and volumetric heat capacity of substrate, silver layer, YBCO, and stabilizer of the CC will affect to the fault current limiting performance and recovery time. This paper presents experimental results about fault current test of commercialized CCs to evaluate their compatibilities for resistive SFCLs and a numerical analysis using finite element method to design an HTS conductor for the SFCLs. The results from the analytical models of the CCs were compared to the experimental results. An HTS tape which is more suitable for the resistive type SFCLs was proposed as a conclusion.

Original languageEnglish
Article number5422874
Pages (from-to)1172-1176
Number of pages5
JournalIEEE Transactions on Applied Superconductivity
Volume20
Issue number3
DOIs
Publication statusPublished - 2010 Jun

Bibliographical note

Funding Information:
Manuscript received October 20, 2009. First published March 01, 2010; current version published May 28, 2010. This research was supported by National Research Lab. Program through the Korea Science and Engineering Foundation funded by the Ministry of Education, Science and Technology (R0A-2007-000-20063-0). Y. J. Kim, D. K. Park, S. E. Yang, W. C. Kim, and T. K. Ko are with the Yonsei University, Korea (e-mail: tkko@yonsei.ac.kr). M. C. Ahn is with Kunsan University, Korea (e-mail: mcahn@kunsan.ac.kr). Y. S. Yoon is with Ansan College of Technology, Ansan, Korea (e-mail: ysyoon@ansantc.ac.kr). N. Y. Kwon and H. Lee are with Department of Materials Science and Engineering, Korea University, Korea (e-mail: haigunlee@korea.ac.kr). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TASC.2010.2040385

Keywords

  • Coated conductor
  • Fault current test
  • Numerical analysis
  • Recovery time measurement
  • Resistive superconducting fault current limiter

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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