Application of a handheld X-ray fluorescence spectrometer for real-time, high-density quantitative analysis of drilled igneous rocks and sediments during IODP Expedition 352

  • J. G. Ryan*
  • , J. W. Shervais
  • , Y. Li
  • , M. K. Reagan
  • , H. Y. Li
  • , D. Heaton
  • , M. Godard
  • , M. Kirchenbaur
  • , S. A. Whattam
  • , J. A. Pearce
  • , T. Chapman
  • , W. Nelson
  • , J. Prytulak
  • , K. Shimizu
  • , K. Petronotis
  • *Corresponding author for this work

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    Engineering

    Earth and Planetary Sciences