Application of a handheld X-ray fluorescence spectrometer for real-time, high-density quantitative analysis of drilled igneous rocks and sediments during IODP Expedition 352
- J. G. Ryan*
- , J. W. Shervais
- , Y. Li
- , M. K. Reagan
- , H. Y. Li
- , D. Heaton
- , M. Godard
- , M. Kirchenbaur
- , S. A. Whattam
- , J. A. Pearce
- , T. Chapman
- , W. Nelson
- , J. Prytulak
- , K. Shimizu
- , K. Petronotis
*Corresponding author for this work
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