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Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD
Dongsup Lim, Dongjin Byun, Gyeungho Kim, Ok Hyun Nam, In Hoon Choi, Dalkeun Park, Dong Wha Kum
Research output: Contribution to journal › Conference article › peer-review
2
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(Scopus)