Abstract
We investigated the composition dependence of the band structure of Ti-alloyed Al oxide (TiAlOx), tunneling magnetoresistance (TMR) behavior of the magnetic tunnel junctions (MTJs) with TiAlOx barrier, and the microstructural evolution of Ti-Al alloy films. X-ray absorption spectroscopy indicated that TiAlOx. had localized d states in the band gap below the conduction band. As the Ti concentration increased, the resistance × area value and effective barrier height of the MTJs were reduced owing to the band-gap reduction of TiAlOx caused by the formation of extra bands, mainly composed of Ti 3d orbitals, within the band gap. The TMR ratio increased up to 49% at 5.33 at. % Ti. Ti alloying enhanced the barrier/electrode interface uniformity and reduced microstructural defects. These structural improvements enhanced not only the TMR effect but also the thermal stability of the MTJs.
| Original language | English |
|---|---|
| Article number | 252501 |
| Pages (from-to) | 1-3 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 86 |
| Issue number | 25 |
| DOIs | |
| Publication status | Published - 2005 |
Bibliographical note
Funding Information:This work was supported by the Korea Ministry of Science and Technology under contract National Research Laboratory program, the Korea Research Foundation Grant (KRF-2004-005-C00068), and the Basic Research Program of the Korea Science and Engineering Foundation Grant (R-01-2005-000-11188-0).
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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