Barrier lowering and leakage current reduction in Ni-AlGaN/GaN Schottky diodes with an oxygen-treated GaN cap layer

Hyeonseok Woo, Jongkyong Lee, Yongcheol Jo, Jaeseok Han, Jongmin Kim, Hyungsang Kim, Cheong Hyun Roh, Jun Ho Lee, Jungho Park, Cheol Koo Hahn, Hyunsik Im*

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    11 Citations (Scopus)

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    Material Science