Bias offset correction technique for uncooled infrared bolometer sensor readout IC

Won Park Sang; Joon Hwang Sang; Woo Ryu Jang; Woo Hong Seung; Young Sung Man

doi:10.1109/EDSSC.2005.1635378

Bias offset correction technique for uncooled infrared bolometer sensor readout IC

Won Park Sang, Joon Hwang Sang, Woo Ryu Jang, Woo Hong Seung, Young Sung Man

* Honorary professors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.

Original language	English
Title of host publication	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	725-728
Number of pages	4
ISBN (Print)	0780393392, 9780780393394
DOIs	https://doi.org/10.1109/EDSSC.2005.1635378
Publication status	Published - 2005
Event	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong Duration: 2005 Dec 19 → 2005 Dec 21

Publication series

Name	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Other

Other	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Country/Territory	Hong Kong
City	Howloon
Period	05/12/19 → 05/12/21

Keywords

Bolometer
Common-mode voltage
Offset
Readout IC

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/EDSSC.2005.1635378

Cite this

Sang, W. P., Sang, J. H., Jang, W. R., Seung, W. H., & Man, Y. S. (2005). Bias offset correction technique for uncooled infrared bolometer sensor readout IC. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (pp. 725-728). Article 1635378 (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2005.1635378

Bias offset correction technique for uncooled infrared bolometer sensor readout IC. / Sang, Won Park; Sang, Joon Hwang; Jang, Woo Ryu et al.
2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. Institute of Electrical and Electronics Engineers Inc., 2005. p. 725-728 1635378 (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sang, WP, Sang, JH, Jang, WR, Seung, WH & Man, YS 2005, Bias offset correction technique for uncooled infrared bolometer sensor readout IC. in 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC., 1635378, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, Institute of Electrical and Electronics Engineers Inc., pp. 725-728, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, Howloon, Hong Kong, 05/12/19. https://doi.org/10.1109/EDSSC.2005.1635378

Sang WP, Sang JH, Jang WR, Seung WH, Man YS. Bias offset correction technique for uncooled infrared bolometer sensor readout IC. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. Institute of Electrical and Electronics Engineers Inc. 2005. p. 725-728. 1635378. (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). doi: 10.1109/EDSSC.2005.1635378

@inproceedings{74dea01807cb421c9de4a7908a1d6d35,

title = "Bias offset correction technique for uncooled infrared bolometer sensor readout IC",

abstract = "Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.",

keywords = "Bolometer, Common-mode voltage, Offset, Readout IC",

author = "Sang, {Won Park} and Sang, {Joon Hwang} and Jang, {Woo Ryu} and Seung, {Woo Hong} and Man, {Young Sung}",

year = "2005",

doi = "10.1109/EDSSC.2005.1635378",

language = "English",

isbn = "0780393392",

series = "2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "725--728",

booktitle = "2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC",

note = "2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC ; Conference date: 19-12-2005 Through 21-12-2005",

}

TY - GEN

T1 - Bias offset correction technique for uncooled infrared bolometer sensor readout IC

AU - Sang, Won Park

AU - Sang, Joon Hwang

AU - Jang, Woo Ryu

AU - Seung, Woo Hong

AU - Man, Young Sung

PY - 2005

Y1 - 2005

N2 - Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.

AB - Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.

KW - Bolometer

KW - Common-mode voltage

KW - Offset

KW - Readout IC

UR - http://www.scopus.com/inward/record.url?scp=43549095754&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=43549095754&partnerID=8YFLogxK

U2 - 10.1109/EDSSC.2005.1635378

DO - 10.1109/EDSSC.2005.1635378

M3 - Conference contribution

AN - SCOPUS:43549095754

SN - 0780393392

SN - 9780780393394

T3 - 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

SP - 725

EP - 728

BT - 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Y2 - 19 December 2005 through 21 December 2005

ER -

Bias offset correction technique for uncooled infrared bolometer sensor readout IC

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this