Bias offset correction technique for uncooled infrared bolometer sensor readout IC

Won Park Sang; Joon Hwang Sang; Woo Ryu Jang; Woo Hong Seung; Young Sung Man

doi:10.1109/EDSSC.2005.1635378

Bias offset correction technique for uncooled infrared bolometer sensor readout IC

Won Park Sang, Joon Hwang Sang, Woo Ryu Jang, Woo Hong Seung, Young Sung Man

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.

Original language	English
Title of host publication	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	725-728
Number of pages	4
ISBN (Print)	0780393392, 9780780393394
DOIs	https://doi.org/10.1109/EDSSC.2005.1635378
Publication status	Published - 2005
Event	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong Duration: 2005 Dec 19 → 2005 Dec 21

Publication series

Name	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Other

Other	2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Country/Territory	Hong Kong
City	Howloon
Period	05/12/19 → 05/12/21

Keywords

Bolometer
Common-mode voltage
Offset
Readout IC

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/EDSSC.2005.1635378

Cite this

Sang, W. P., Sang, J. H., Jang, W. R., Seung, W. H., & Man, Y. S. (2005). Bias offset correction technique for uncooled infrared bolometer sensor readout IC. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (pp. 725-728). Article 1635378 (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2005.1635378

Bias offset correction technique for uncooled infrared bolometer sensor readout IC. / Sang, Won Park; Sang, Joon Hwang; Jang, Woo Ryu et al.
2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. Institute of Electrical and Electronics Engineers Inc., 2005. p. 725-728 1635378 (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sang, WP, Sang, JH, Jang, WR, Seung, WH & Man, YS 2005, Bias offset correction technique for uncooled infrared bolometer sensor readout IC. in 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC., 1635378, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, Institute of Electrical and Electronics Engineers Inc., pp. 725-728, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, Howloon, Hong Kong, 05/12/19. https://doi.org/10.1109/EDSSC.2005.1635378

Sang WP, Sang JH, Jang WR, Seung WH, Man YS. Bias offset correction technique for uncooled infrared bolometer sensor readout IC. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. Institute of Electrical and Electronics Engineers Inc. 2005. p. 725-728. 1635378. (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). doi: 10.1109/EDSSC.2005.1635378

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title = "Bias offset correction technique for uncooled infrared bolometer sensor readout IC",

abstract = "Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.",

keywords = "Bolometer, Common-mode voltage, Offset, Readout IC",

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AB - Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.

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Bias offset correction technique for uncooled infrared bolometer sensor readout IC

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