Fingerprint
Dive into the research topics of 'Bias-stress stability of top-gate coplanar a-ITGZO TFTs with HfO2 and HfAlO gate dielectrics'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Bias-stress stability of top-gate coplanar a-ITGZO TFTs with HfO2 and HfAlO gate dielectrics
Heesung Kong, Kyoungah Cho, Hosang Lee, Seungjun Lee, Junhyung Lim, Sangsig Kim
Research output: Contribution to journal › Article › peer-review
10
Citations
(Scopus)