Bias voltage dependence of magnetic of tunnel junctions comprising double barriers and CoFe/NiFeSiB/CoFe free layer

Y. Kim, Y. Kim, B. Chun, D. Kim, J. Hwang, S. Kim, J. Rhee, T. Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'Bias voltage dependence of magnetic of tunnel junctions comprising double barriers and CoFe/NiFeSiB/CoFe free layer'. Together they form a unique fingerprint.