Skip to main navigation
Skip to search
Skip to main content
Korea University Pure Home
Home
Profiles
Research units
Equipment
Research output
Press/Media
Search by expertise, name or affiliation
Bias voltage dependence of magnetic tunnel junctions comprising double barriers and CoFe/NiFeSiB/CoFe free layer
You Song Kim
, Byong Sun Chun
, Deok Kee Kim
,
Young Keun Kim
Research output
:
Contribution to journal
›
Article
›
peer-review
1
Citation (Scopus)
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Bias voltage dependence of magnetic tunnel junctions comprising double barriers and CoFe/NiFeSiB/CoFe free layer'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
CoFe
100%
Free Layer
100%
Magnetic Tunnel Junction
100%
Bias Voltage Dependence
100%
Double Barrier
100%
Double-barrier Magnetic Tunnel Junction
57%
Tunneling Magnetoresistance
42%
IrMn
28%
Transmission Electron Microscopy
14%
Atomic Force Microscopy
14%
Coercivity
14%
Interlayer Coupling
14%
Coupled Field
14%
Magnetostatics
14%
Junction Structure
14%
Force Transmission
14%
Area Specific Resistance
14%
Columnar Growth
14%
Néel Coupling
14%
Wavy Interface
14%
Medicine and Dentistry
Atomic Force Microscopy
100%
Transmission Electron Microscopy
100%
Material Science
Tunneling Magnetoresistance
100%
Transmission Electron Microscopy
33%