Abstract
This paper determines mechanisms to mitigate errors when implementing Boolean functions in nano-circuits. Nano-fabrics are expected to have high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap, but unreliable nano-device as the main function and reliable, but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don't-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm. (Here, the word "dynamic programming" is used in the same sense as computer-science literature, i.e., and as an efficient search algorithm over trees.)
Original language | English |
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Article number | 6042351 |
Pages (from-to) | 2054-2065 |
Number of pages | 12 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 20 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2012 |
Externally published | Yes |
Keywords
- Cyclic codes
- don't-care (DC) substitution
- error correction
- nano-fabrics
ASJC Scopus subject areas
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering