Carrier removal rates and deep traps in neutron irradiated n-GaN films
- In Hwan Lee*
- , A. Y. Polyakov
- , N. B. Smirnov
- , A. V. Govorkov
- , E. A. Kozhukhova
- , N. G. Kolin
- , V. M. Boiko
- , A. V. Korulin
- , S. J. Pearton
*Corresponding author for this work
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