Change in electrical resistance and thermal stability of nitrogen incorporated Ge2Sb2Te5 films

YoungKuk Kim, Uk Hwang, Yong Jai Cho, H. M. Park, M. H. Cho, Pyeong Seok Cho, Jong Heun Lee

    Research output: Contribution to journalArticlepeer-review

    36 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Change in electrical resistance and thermal stability of nitrogen incorporated Ge2Sb2Te5 films'. Together they form a unique fingerprint.

    Keyphrases

    Material Science

    Chemical Engineering