Channel access resistance effects on charge carrier mobility and low-frequency noise in a polymethyl methacrylate passivated SnO2 nanowire field-effect transistors

Min Kyu Joo, Junghwan Huh, Mireille Mouis, So Jeong Park, Dae Young Jeon, Doyoung Jang, Jong Heun Lee, Gyu-Tae Kim, Gérard Ghibaudo

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Channel access resistance effects on charge carrier mobility and low-frequency noise in a polymethyl methacrylate passivated SnO2 nanowire field-effect transistors'. Together they form a unique fingerprint.

Engineering

Keyphrases