Characterization of CMOS pixel detectors for digital X-ray imaging

Min Kook Cho, Ho Kyung Kim, Thorsten Graeve, Jung Min Kim

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)


In order to develop a cost-effective digital X-ray imaging system, we considered a CMOS (complementary metal-oxide-semiconductor) photodiode array in conjunction with a scintillation screen. Imaging performance was evaluated in terms of MTF (modulation-transfer function), NPS (noise-power spectrum) and DQE (detective quantum efficiency). The presampled MTF was measured using a slanted-slit method. The NPS was determined by 2-dimensional Fourier analysis. Both the measured MTF and NPS, and a self-developed computational model for the X-ray spectral analysis were used to determine the spatial frequency-dependent DQE. From the measured MTF, the spatial resolution was found to be about 10.5 line pairs per millimeter (1p/mm). For a 45-kVp tungsten spectrum, the measured DQE around zero spatial frequency was about 40%.

Original languageEnglish
Pages (from-to)1052-1055
Number of pages4
JournalKey Engineering Materials
Volume321-323 II
Publication statusPublished - 2006


  • Computed Tomography
  • DQE
  • Digital Radiography
  • MTF
  • NPS
  • X-ray imaging

ASJC Scopus subject areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering


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