Characterization of CMOS pixel detectors for digital X-ray imaging

In order to develop a cost-effective digital X-ray imaging system, we considered a CMOS (complementary metal-oxide-semiconductor) photodiode array in conjunction with a scintillation screen. Imaging performance was evaluated in terms of MTF (modulation-transfer function), NPS (noise-power spectrum) and DQE (detective quantum efficiency). The presampled MTF was measured using a slanted-slit method. The NPS was determined by 2-dimensional Fourier analysis. Both the measured MTF and NPS, and a self-developed computational model for the X-ray spectral analysis were used to determine the spatial frequency-dependent DQE. From the measured MTF, the spatial resolution was found to be about 10.5 line pairs per millimeter (1p/mm). For a 45-kVp tungsten spectrum, the measured DQE around zero spatial frequency was about 40%.