Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Yeongkon Jeong, Soo Jong Park, Sang Hun Lee, Byeong Kwon Ju, Young Min Jhon, Minah Seo

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.

    Original languageEnglish
    Title of host publication23rd Opto-Electronics and Communications Conference, OECC 2018
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781538691458
    DOIs
    Publication statusPublished - 2018 Jul
    Event23rd Opto-Electronics and Communications Conference, OECC 2018 - Jeju, Korea, Republic of
    Duration: 2018 Jul 22018 Jul 6

    Publication series

    Name23rd Opto-Electronics and Communications Conference, OECC 2018

    Conference

    Conference23rd Opto-Electronics and Communications Conference, OECC 2018
    Country/TerritoryKorea, Republic of
    CityJeju
    Period18/7/218/7/6

    Bibliographical note

    Funding Information:
    This work was supported by the KIST Institutional Programs (Project No. 2E28280 and 2V05885) and The National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (2016R1A2B2010858).

    Publisher Copyright:
    © 2018 IEEE.

    ASJC Scopus subject areas

    • Computer Networks and Communications
    • Hardware and Architecture
    • Atomic and Molecular Physics, and Optics

    Fingerprint

    Dive into the research topics of 'Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy'. Together they form a unique fingerprint.

    Cite this