Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Yeongkon Jeong; Soo Jong Park; Sang Hun Lee; Byeong Kwon Ju; Young Min Jhon; Minah Seo

doi:10.1109/OECC.2018.8730086

Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Yeongkon Jeong, Soo Jong Park, Sang Hun Lee, Byeong Kwon Ju, Young Min Jhon, Minah Seo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.

Original language	English
Title of host publication	23rd Opto-Electronics and Communications Conference, OECC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538691458
DOIs	https://doi.org/10.1109/OECC.2018.8730086
Publication status	Published - 2018 Jul
Event	23rd Opto-Electronics and Communications Conference, OECC 2018 - Jeju, Korea, Republic of Duration: 2018 Jul 2 → 2018 Jul 6

Publication series

Name	23rd Opto-Electronics and Communications Conference, OECC 2018

Conference

Conference	23rd Opto-Electronics and Communications Conference, OECC 2018
Country/Territory	Korea, Republic of
City	Jeju
Period	18/7/2 → 18/7/6

Bibliographical note

Funding Information:
This work was supported by the KIST Institutional Programs (Project No. 2E28280 and 2V05885) and The National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (2016R1A2B2010858).

Publisher Copyright:
© 2018 IEEE.

ASJC Scopus subject areas

Computer Networks and Communications
Hardware and Architecture
Atomic and Molecular Physics, and Optics

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10.1109/OECC.2018.8730086

Cite this

Jeong, Y., Park, S. J., Lee, S. H., Ju, B. K., Jhon, Y. M., & Seo, M. (2018). Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018 Article 8730086 (23rd Opto-Electronics and Communications Conference, OECC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OECC.2018.8730086

Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. / Jeong, Yeongkon; Park, Soo Jong; Lee, Sang Hun et al.
23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 8730086 (23rd Opto-Electronics and Communications Conference, OECC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Jeong, Y, Park, SJ, Lee, SH, Ju, BK, Jhon, YM & Seo, M 2018, Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. in 23rd Opto-Electronics and Communications Conference, OECC 2018., 8730086, 23rd Opto-Electronics and Communications Conference, OECC 2018, Institute of Electrical and Electronics Engineers Inc., 23rd Opto-Electronics and Communications Conference, OECC 2018, Jeju, Korea, Republic of, 18/7/2. https://doi.org/10.1109/OECC.2018.8730086

Jeong Y, Park SJ, Lee SH, Ju BK, Jhon YM, Seo M. Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 8730086. (23rd Opto-Electronics and Communications Conference, OECC 2018). doi: 10.1109/OECC.2018.8730086

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abstract = "We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.",

author = "Yeongkon Jeong and Park, {Soo Jong} and Lee, {Sang Hun} and Ju, {Byeong Kwon} and Jhon, {Young Min} and Minah Seo",

note = "Funding Information: This work was supported by the KIST Institutional Programs (Project No. 2E28280 and 2V05885) and The National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (2016R1A2B2010858). Publisher Copyright: {\textcopyright} 2018 IEEE.; 23rd Opto-Electronics and Communications Conference, OECC 2018 ; Conference date: 02-07-2018 Through 06-07-2018",

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Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Abstract

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Bibliographical note

ASJC Scopus subject areas

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