Characterization of high-resistivity poly-CdZnTe thick films grown by thermal evaporation method

K. H. Kim, Y. H. Na, Y. J. Park, T. R. Jung, S. U. Kim, J. K. Hong

    Research output: Contribution to journalArticlepeer-review

    36 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Characterization of high-resistivity poly-CdZnTe thick films grown by thermal evaporation method'. Together they form a unique fingerprint.

    Keyphrases

    Engineering

    Material Science